The advantage of low growth temperature and V/III ratio for In xGa1-xAs nanowires growth

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Edy Wibowo, Zulkafli Othaman, Samsudi Sakrani, Imam Sumpono

2011 Nano Vol. 6 Issue 2 Article Cited by 4

Abstract

Cylindrical InxGa1-xAs nanowires (NWs) perpendicular to the substrate have been successfully grown using MOCVD. Morphology of In xGa1-xAs NWs has been observed using Field Emission-Scanning Electron Microscopy (FE-SEM) and Transmission Electron Microscopy (TEM). Both FE-SEM and TEM results show that the NWs grown at low growth temperature and V/III ratio were via direct impinging mechanism. Energy Dispersive X-ray spectroscopy (EDX) results confirm that the cylindrical NWs grown via direct impinging mechanism and tends to have uniform chemical composition. © 2011 World Scientific Publishing Company.

Affiliations

Ibnu Sina Institute for Fundamental Science Studies, Universiti Teknologi Malaysia, 81310 UTM Skudai, Johor, Malaysia; Department of Physics, Faculty of Science, Universiti Teknologi Malaysia, 81310 UTM Skudai, Johor, Malaysia; Department of Physics, Faculty of Mathematic and Science, Universitas Negeri Semarang, Semarang, Indonesia